Offres CDD SEM

spectroscopy, photoluminescence), chemical (FTIR, Raman, EDX) and structural (SEM, TEM, X-ray diffraction) characterisation... - Voir cette offre d'emploi

, nanometrology (i.e. profilometry, AFM, SEM), and image processing. 2) Measure and analyze the propagation of MHz to GHz ultrasonic... - Voir cette offre d'emploi

properties according to the tool life (SEM images, EBSD mapping, X-ray diffraction (XRD) analysis, surface topography... - Voir cette offre d'emploi

microscopy (SEM), XRD and TEM by considering different deposition times. For this, a system to position the substrate in a water... - Voir cette offre d'emploi

sputtering and will characterize the produced devices by electrical transport, SEM, TEM, Raman, AFM, XRD… 2) Electrical tests... equipment are available at the IMN, as well as many characterization techniques (XRD, SEM, HR-TEM, XPS, electrical measurements... - Voir cette offre d'emploi

optics, the relationship between optical properties and material structure elucidated by complementary microscopies (SEM... - Voir cette offre d'emploi

, nanometrology (i.e. profilometry, AFM, SEM), and image processing. 2) Measure and analyze the propagation of MHz to GHz ultrasonic... - Voir cette offre d'emploi

: the integration of a focused ion probe (Focus Ion Beam, FIB) into a Scanning Electron Microscope (SEM) enables material.... The first objective is therefore to develop the SEM-FIB-DIC analysis protocol based on samples with simple, known residual... - Voir cette offre d'emploi

by complementary microscopy (SEM, TEM, AFM). As a member of the Complex Photonic Materials and Systems team, the post-doctoral... - Voir cette offre d'emploi

characterization of the prepared microstructures with XRD, SEM, DSC/r´esistivity, TEM. A particular attention will be drawn on carbide..., resistivity, SEM, TEM...). Mechanical properties of the selected alloys will be assessed with simple tests (compression mainly... - Voir cette offre d'emploi